Temperature mapping by μ-Raman spectroscopy over cross-section area of power diode in forward biased conditions

Thierry Kociniewski, Jeff Moussodji, Zoubir Khatir. Temperature mapping by μ-Raman spectroscopy over cross-section area of power diode in forward biased conditions. Microelectronics Reliability, 55(3-4):547-551, 2015. [doi]

Abstract

Abstract is missing.