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Sreekumar V. Kodakara, Deepak Mathaikutty, Ajit Dingankar, Sandeep K. Shukla, David J. Lilja. Model Based Test Generation for Microprocessor Architecture Validation. In 20th International Conference on VLSI Design (VLSI Design 2007), Sixth International Conference on Embedded Systems (ICES 2007), 6-10 January 2007, Bangalore, India. pages 465-472, IEEE Computer Society, 2007. [doi]

This author has not been identified. Look up 'Sreekumar V. Kodakara' in GoogleThis author has not been identified. Look up 'Deepak Mathaikutty' in GoogleThis author has not been identified. Look up 'Ajit Dingankar' in GoogleThis author has not been identified. Look up 'Sandeep K. Shukla' in GoogleThis author has not been identified. It may be one of the following persons:

David J. Lilja

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