Extracting effective functional tests from commercial programs

Sreekumar Vadakke Kodakara, Mehul V. Sagar, Joel Yuen. Extracting effective functional tests from commercial programs. In 33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015. pages 1-6, IEEE, 2015. [doi]

Abstract

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