Advanced functional safety mechanisms for embedded memories and IPs in automotive SoCs

T. Kogan, Y. Abotbol, G. Boschi, Gurgen Harutyunyan, I. Kroul, H. Shaheen, Yervant Zorian. Advanced functional safety mechanisms for embedded memories and IPs in automotive SoCs. In IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017. pages 1-6, IEEE, 2017. [doi]

Abstract

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