Yasuharu Kohiyama, C. P. Ravikumar, Yasuo Sato, Laung-Terng Wang, Yervant Zorian. Next Generation Test, Diagnostics and Yield Challenges for EDA, ATE, IP and Fab - A Perspective from All Sides. In 16th Asian Test Symposium, ATS 2007, Beijing, China, October 8-11, 2007. pages 207, IEEE, 2007. [doi]
Abstract is missing.