Memory Yield Improvement through Multiple Test Sequences and Application-Aware Fault Models - researchr publication authors

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Aman Kokrady, C. P. Ravikumar, Nitin Chandrachoodan. Memory Yield Improvement through Multiple Test Sequences and Application-Aware Fault Models. In 21st International Conference on VLSI Design (VLSI Design 2008), 4-8 January 2008, Hyderabad, India. pages 169-174, IEEE Computer Society, 2008. [doi]

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