Aman Kokrady, C. P. Ravikumar, Nitin Chandrachoodan. Memory Yield Improvement through Multiple Test Sequences and Application-Aware Fault Models. In 21st International Conference on VLSI Design (VLSI Design 2008), 4-8 January 2008, Hyderabad, India. pages 169-174, IEEE Computer Society, 2008. [doi]
@inproceedings{KokradyRC08,
title = {Memory Yield Improvement through Multiple Test Sequences and Application-Aware Fault Models},
author = {Aman Kokrady and C. P. Ravikumar and Nitin Chandrachoodan},
year = {2008},
doi = {10.1109/VLSI.2008.115},
url = {http://doi.ieeecomputersociety.org/10.1109/VLSI.2008.115},
tags = {testing, C++, context-aware},
researchr = {https://researchr.org/publication/KokradyRC08},
cites = {0},
citedby = {0},
pages = {169-174},
booktitle = {21st International Conference on VLSI Design (VLSI Design 2008), 4-8 January 2008, Hyderabad, India},
publisher = {IEEE Computer Society},
}