Sekhar Reddy Kola, Yiming Li, Chieh-Yang Chen, Min-Hui Chuang. A Unified Statistical Analysis of Comprehensive Fluctuations of Gate-All-Around Silicon Nanosheet MOSFETs Induced by RDF, ITF, and WKF Simultaneously. In 23rd International Symposium on Quality Electronic Design, ISQED 2022, Santa Clara, CA, USA, April 6-7, 2022. pages 1-6, IEEE, 2022. [doi]
Abstract is missing.