Tom Kolan, Hillel Mendelson, Vitali Sokhin, Shai Doron, Hernan Theiler, Shay Aviv, Hagai Hadad, Natalia Freidman, Elena Tsanko, John M. Ludden, Bryant Cockcroft. Post Silicon Validation of the MMU. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2021, Grenoble, France, February 1-5, 2021. pages 212-217, IEEE, 2021. [doi]
Abstract is missing.