TEACH: Outlier Oriented Testing of Analog/Mixed-Signal Circuits Using One-class Hyperdimensional Clustering - researchr publication authors

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Suhasini Komarraju, Mohamed Mejri, Abhijit Chatterjee, Suriyaprakash Natarajan, Prashant Goteti. TEACH: Outlier Oriented Testing of Analog/Mixed-Signal Circuits Using One-class Hyperdimensional Clustering. In IEEE International Test Conference, ITC 2024, San Diego, CA, USA, November 3-8, 2024. pages 426-435, IEEE, 2024. [doi]

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Mohamed Mejri

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