TEACH: Outlier Oriented Testing of Analog/Mixed-Signal Circuits Using One-class Hyperdimensional Clustering

Suhasini Komarraju, Mohamed Mejri, Abhijit Chatterjee, Suriyaprakash Natarajan, Prashant Goteti. TEACH: Outlier Oriented Testing of Analog/Mixed-Signal Circuits Using One-class Hyperdimensional Clustering. In IEEE International Test Conference, ITC 2024, San Diego, CA, USA, November 3-8, 2024. pages 426-435, IEEE, 2024. [doi]

@inproceedings{KomarrajuMCNG24,
  title = {TEACH: Outlier Oriented Testing of Analog/Mixed-Signal Circuits Using One-class Hyperdimensional Clustering},
  author = {Suhasini Komarraju and Mohamed Mejri and Abhijit Chatterjee and Suriyaprakash Natarajan and Prashant Goteti},
  year = {2024},
  doi = {10.1109/ITC51657.2024.00065},
  url = {https://doi.org/10.1109/ITC51657.2024.00065},
  researchr = {https://researchr.org/publication/KomarrajuMCNG24},
  cites = {0},
  citedby = {0},
  pages = {426-435},
  booktitle = {IEEE International Test Conference, ITC 2024, San Diego, CA, USA, November 3-8, 2024},
  publisher = {IEEE},
  isbn = {979-8-3315-2013-7},
}