Masaaki Kondo, Hiroaki Kobayashi, Ryuichi Sakamoto, Motoki Wada, Jun Tsukamoto, Mitaro Namiki, Weihan Wang, Hideharu Amano, Kensaku Matsunaga, Masaru Kudo, Kimiyoshi Usami, Toshiya Komoda, Hiroshi Nakamura. Design and evaluation of fine-grained power-gating for embedded microprocessors. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2014, Dresden, Germany, March 24-28, 2014. pages 1-6, IEEE, 2014. [doi]
Abstract is missing.