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Bayesian Diagnosability and Active Fault Identification

Chun-Wei Kong, Jay W. McMahon, Morteza Lahijanian. Bayesian Diagnosability and Active Fault Identification. In 64th IEEE Conference on Decision and Control, CDC 2025, Rio de Janeiro, Brazil, December 9-12, 2025. pages 6439-6445, IEEE, 2025. [doi]

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