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Fine-Grain Voltage Tuned Cache Architecture for Yield Management Under Process Variations

Joonho Kong, Yan Pan, Serkan Ozdemir, Anitha Mohan, Gokhan Memik, Sung Woo Chung. Fine-Grain Voltage Tuned Cache Architecture for Yield Management Under Process Variations. IEEE Trans. VLSI Syst., 20(8):1532-1536, 2012. [doi]

Authors

Joonho Kong

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Yan Pan

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Serkan Ozdemir

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Anitha Mohan

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Gokhan Memik

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Sung Woo Chung

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