Analysis of Retention Time Distribution of Embedded DRAM - A New Method to Characterize Across-Chip Threshold Voltage Variation - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Wei Kong, Paul C. Parries, G. Wang, Subramanian S. Iyer. Analysis of Retention Time Distribution of Embedded DRAM - A New Method to Characterize Across-Chip Threshold Voltage Variation. In Douglas Young, Nur A. Touba, editors, 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008. pages 1-7, IEEE, 2008. [doi]

This author has not been identified. Look up 'Wei Kong' in GoogleThis author has not been identified. Look up 'Paul C. Parries' in GoogleThis author has not been identified. Look up 'G. Wang' in GoogleThis author has not been identified. Look up 'Subramanian S. Iyer' in Google

runs on WebDSL