Compact test sets for industrial circuits

M. H. Konijnenburg, J. Th. van der Linden, A. J. van de Goor. Compact test sets for industrial circuits. In 13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA. pages 358-366, IEEE Computer Society, 1995. [doi]

Authors

M. H. Konijnenburg

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J. Th. van der Linden

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A. J. van de Goor

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