M. H. Konijnenburg, J. Th. van der Linden, A. J. van de Goor. Compact test sets for industrial circuits. In 13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA. pages 358-366, IEEE Computer Society, 1995. [doi]
@inproceedings{KonijnenburgLG95,
title = {Compact test sets for industrial circuits},
author = {M. H. Konijnenburg and J. Th. van der Linden and A. J. van de Goor},
year = {1995},
url = {http://csdl.computer.org/comp/proceedings/vts/1995/7000/00/70000358abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/KonijnenburgLG95},
cites = {0},
citedby = {0},
pages = {358-366},
booktitle = {13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA},
publisher = {IEEE Computer Society},
}