Mario H. Konijnenburg, Hans van der Linden, A. J. van de Goor. Fault (In)Dependent Cost Estimates and Conflict-Directed Backtracking to Guide Sequential Circuit Test Generation. In 8th Asian Test Symposium (ATS 99), 16-18 November 1999, Shanghai, China. pages 185-191, IEEE Computer Society, 1999. [doi]
Abstract is missing.