Electrical characteristics of novel ESD protection devices for I/O and power clamp

Yong-Seo Koo, Kwang-Yeob Lee, Joong-Ho Choi, Chan-Ho Lee, Yoon-Sik Lee, Yil Suk Yang. Electrical characteristics of novel ESD protection devices for I/O and power clamp. In International Symposium on Circuits and Systems (ISCAS 2011), May 15-19 2011, Rio de Janeiro, Brazil. pages 937-940, IEEE, 2011. [doi]

Abstract

Abstract is missing.