John C. Koob, Sue Ann Ung, Ashwin S. Rao, Daniel A. Leder, Craig S. Joly, Kristopher C. Breen, Tyler L. Brandon, Michael Hume, Bruce F. Cockburn, Duncan G. Elliott. Test and Characterization of a Variable-Capacity Multilevel DRAM. In 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA. pages 189-197, IEEE Computer Society, 2005. [doi]
Abstract is missing.