Testing of High Resolution ADCs Using Lower Resolution DACs via Iterative Transfer Function Estimation - researchr publication related

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S. Kook, Vishwanath Natarajan, Abhijit Chatterjee, Shalabh Goyal, Le Jin. Testing of High Resolution ADCs Using Lower Resolution DACs via Iterative Transfer Function Estimation. In 14th IEEE European Test Symposium, ETS 2009, Sevilla, Spain, May 25-29, 2009. pages 3-8, IEEE Computer Society, 2009. [doi]

The following publications are possibly variants of this publication:

Testing of Precision DAC Using Low-Resolution ADC With WobblingLe Jin, Hosam Haggag, Randall L. Geiger, Degang Chen. tim, 57(5):940-946, 2008. [doi]

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