S. Kook, Vishwanath Natarajan, Abhijit Chatterjee, Shalabh Goyal, Le Jin. Testing of High Resolution ADCs Using Lower Resolution DACs via Iterative Transfer Function Estimation. In 14th IEEE European Test Symposium, ETS 2009, Sevilla, Spain, May 25-29, 2009. pages 3-8, IEEE Computer Society, 2009. [doi]
Abstract is missing.