Cache- and register-aware system reliability evaluation based on data lifetime analysis

Maha Kooli, Firas Kaddachi, Giorgio Di Natale, Alberto Bosio. Cache- and register-aware system reliability evaluation based on data lifetime analysis. In 34th IEEE VLSI Test Symposium, VTS 2016, Las Vegas, NV, USA, April 25-27, 2016. pages 1-6, IEEE Computer Society, 2016. [doi]

@inproceedings{KooliKNB16,
  title = {Cache- and register-aware system reliability evaluation based on data lifetime analysis},
  author = {Maha Kooli and Firas Kaddachi and Giorgio Di Natale and Alberto Bosio},
  year = {2016},
  doi = {10.1109/VTS.2016.7477299},
  url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2016.7477299},
  researchr = {https://researchr.org/publication/KooliKNB16},
  cites = {0},
  citedby = {0},
  pages = {1-6},
  booktitle = {34th IEEE VLSI Test Symposium, VTS 2016, Las Vegas, NV, USA, April 25-27, 2016},
  publisher = {IEEE Computer Society},
  isbn = {978-1-4673-8454-4},
}