Maha Kooli, Firas Kaddachi, Giorgio Di Natale, Alberto Bosio. Cache- and register-aware system reliability evaluation based on data lifetime analysis. In 34th IEEE VLSI Test Symposium, VTS 2016, Las Vegas, NV, USA, April 25-27, 2016. pages 1-6, IEEE Computer Society, 2016. [doi]
Abstract is missing.