Off-Line Testing of Asynchronous Circuits

Deepali Koppad, Alexandre V. Bystrov, Alexandre Yakovlev. Off-Line Testing of Asynchronous Circuits. In 18th International Conference on VLSI Design (VLSI Design 2005), with the 4th International Conference on Embedded Systems Design, 3-7 January 2005, Kolkata, India. pages 730-735, IEEE Computer Society, 2005. [doi]

Abstract

Abstract is missing.