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Investigating the effective parameters in the Atomic Force Microscope-based dynamic manipulation of rough micro/nanoparticles by using the Sobol sensitivity analysis method

M. H. Korayem, M. Taheri, M. Ghasemi, H. Badkoobehhezavh. Investigating the effective parameters in the Atomic Force Microscope-based dynamic manipulation of rough micro/nanoparticles by using the Sobol sensitivity analysis method. Simulation, 91(12):1068-1080, 2015. [doi]

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