Martin Kosakowski, Reimund Wittmann, Werner Schardein. Statistical averaging based linearity optimization for resistor string DAC architectures in nanoscale processes. In 21st Annual IEEE International SoC Conference, SoCC 2008, September 17-20, 2008, Radisson Hotel, Newport Beach, CA, USA, Proceedings. pages 261-266, IEEE, 2008. [doi]
Abstract is missing.