René Kothe, Heinrich Theodor Vierhaus. Test Data and Power Reductions for Transition Delay Tests for Massive-Parallel Scan Structures. In Sebastián López, editor, 13th Euromicro Conference on Digital System Design, Architectures, Methods and Tools, DSD 2010, 1-3 September 2010, Lille, France. pages 283-290, IEEE, 2010. [doi]
@inproceedings{KotheV10, title = {Test Data and Power Reductions for Transition Delay Tests for Massive-Parallel Scan Structures}, author = {René Kothe and Heinrich Theodor Vierhaus}, year = {2010}, doi = {10.1109/DSD.2010.89}, url = {http://dx.doi.org/10.1109/DSD.2010.89}, tags = {testing}, researchr = {https://researchr.org/publication/KotheV10}, cites = {0}, citedby = {0}, pages = {283-290}, booktitle = {13th Euromicro Conference on Digital System Design, Architectures, Methods and Tools, DSD 2010, 1-3 September 2010, Lille, France}, editor = {Sebastián López}, publisher = {IEEE}, isbn = {978-0-7695-4171-6}, }