Effective tunneling capacitance: a new metric to quantify transient gate leakage current

Elias Kougianos, Saraju P. Mohanty. Effective tunneling capacitance: a new metric to quantify transient gate leakage current. In International Symposium on Circuits and Systems (ISCAS 2006), 21-24 May 2006, Island of Kos, Greece. IEEE, 2006. [doi]

Authors

Elias Kougianos

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Saraju P. Mohanty

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