Elias Kougianos, Saraju P. Mohanty. Effective tunneling capacitance: a new metric to quantify transient gate leakage current. In International Symposium on Circuits and Systems (ISCAS 2006), 21-24 May 2006, Island of Kos, Greece. IEEE, 2006. [doi]
@inproceedings{KougianosM06, title = {Effective tunneling capacitance: a new metric to quantify transient gate leakage current}, author = {Elias Kougianos and Saraju P. Mohanty}, year = {2006}, doi = {10.1109/ISCAS.2006.1693240}, url = {http://dx.doi.org/10.1109/ISCAS.2006.1693240}, researchr = {https://researchr.org/publication/KougianosM06}, cites = {0}, citedby = {0}, booktitle = {International Symposium on Circuits and Systems (ISCAS 2006), 21-24 May 2006, Island of Kos, Greece}, publisher = {IEEE}, }