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Elias Kougianos, Saraju P. Mohanty. Effective tunneling capacitance: a new metric to quantify transient gate leakage current. In International Symposium on Circuits and Systems (ISCAS 2006), 21-24 May 2006, Island of Kos, Greece. IEEE, 2006. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Metrics to Quantify Steady and Transient Gate Leakage in Nanoscale Transistors: NMOS vs. PMOS PerspectiveElias Kougianos, Saraju P. Mohanty. vlsid 2007: 195-200 [doi] Steady and Transient State Analysis of Gate Leakage Current in Nanoscale CMOS Logic GatesSaraju P. Mohanty, Elias Kougianos. iccd 2006: 210-215 [doi]
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