M. Koutsoureli, L. Michalas, George Papaioannou. Temperature effects on the bulk discharge current of dielectric films of MEMS capacitive switches. Microelectronics Reliability, 52(9-10):2240-2244, 2012. [doi]
@article{KoutsoureliMP12,
title = {Temperature effects on the bulk discharge current of dielectric films of MEMS capacitive switches},
author = {M. Koutsoureli and L. Michalas and George Papaioannou},
year = {2012},
doi = {10.1016/j.microrel.2012.06.005},
url = {http://dx.doi.org/10.1016/j.microrel.2012.06.005},
researchr = {https://researchr.org/publication/KoutsoureliMP12},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {52},
number = {9-10},
pages = {2240-2244},
}