Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors - researchr publication authors

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Dimitrios N. Kouvatsos, Vojkan Davidovic, G. J. Papaioannou, Ninoslav Stojadinovic, L. Michalas, M. A. Exarchos, Apostolos T. Voutsas, D. Goustouridis. Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors. Microelectronics Reliability, 44(9-11):1631-1636, 2004. [doi]

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