Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors - researchr publication related

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Dimitrios N. Kouvatsos, Vojkan Davidovic, G. J. Papaioannou, Ninoslav Stojadinovic, L. Michalas, M. A. Exarchos, Apostolos T. Voutsas, D. Goustouridis. Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors. Microelectronics Reliability, 44(9-11):1631-1636, 2004. [doi]

The following publications are possibly variants of this publication:

Influence of polysilicon film thickness on radiation response of advanced excimer laser annealed polycrystalline silicon thin film transistorsV. Davidovic, Dimitrios N. Kouvatsos, Ninoslav Stojadinovic, Apostolos T. Voutsas. mr, 47(9-11):1841-1845, 2007. [doi]

An experimental study of the thermally activated processes in polycrystalline silicon thin film transistorsL. Michalas, M. Exarchos, G. J. Papaioannou, Dimitrios N. Kouvatsos, Apostolos T. Voutsas. mr, 47(12):2058-2064, 2007. [doi]

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