Joseph P. Kozak, Qihao Song, Ruizhe Zhang 0003, Jingcun Liu, Yuhao Zhang. Robustness of GaN Gate Injection Transistors under Repetitive Surge Energy and Overvoltage. In IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021. pages 1-5, IEEE, 2021. [doi]
Abstract is missing.