Joseph P. Kozak, Qihao Song, Jingcun Liu, Ruizhe Zhang 0003, Qiang Li, Wataru Saito, Yuhao Zhang. Accelerating the Recovery of p-Gate GaN HEMTs after Overvoltage Stresses. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 22-1, IEEE, 2022. [doi]
Abstract is missing.