Andrzej Krasniewski. Concurrent Error Detection in Sequential Circuits Implemented Using Embedded Memory of LUT-Based FPGAs. In 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings. pages 487-495, IEEE Computer Society, 2004. [doi]
Abstract is missing.