Automatic Design of Exhaustively Self-Testing Chips with Bilbo Modules

Andrzej Krasniewski, Alexander Albicki. Automatic Design of Exhaustively Self-Testing Chips with Bilbo Modules. In Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985. pages 362-371, IEEE Computer Society, 1985.

@inproceedings{KrasniewskiA85:0,
  title = {Automatic Design of Exhaustively Self-Testing Chips with Bilbo Modules},
  author = {Andrzej Krasniewski and Alexander Albicki},
  year = {1985},
  tags = {testing, design},
  researchr = {https://researchr.org/publication/KrasniewskiA85%3A0},
  cites = {0},
  citedby = {0},
  pages = {362-371},
  booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985},
  publisher = {IEEE Computer Society},
}