Alexander Albicki - researchr alias

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Viewing Publication 1 - 21 from 21

1996

Reducing power dissipation in CMOS circuits by signal probability based transistor reorderingRazak Hossain, Menghui Zheng, Alexander Albicki. tcad, 15(3):361-368, 1996. [doi]

Extended hyperbolic congruential frequency hop code: generation and bounds for cross- and auto-ambiguity functionLeszek D. Wronski, Razak Hossain, Alexander Albicki. tcom, 44(3):301-305, 1996. [doi]

1995

Efficient testability enhancement for combinational circuitYu Fang, Alexander Albicki. iccd 1995: 168-179 [doi]

Low power and high speed multiplication design through mixed number representationsMenghui Zheng, Alexander Albicki. iccd 1995: 566-576 [doi]

1994

1993

Double Edge Triggered Devices: Speed and Power ConsiderationsRazak Hossain, Leszek D. Wronski, Alexander Albicki. iscas 1993: 1491-1494

Locally clocked microprocessorStephen J. Muscato, Alexander Albicki. glvlsi 1993: 47-51 [doi]

Bit-Splitting for Testability Enhancement in Scan-Based DesignXiaodong Xie, Alexander Albicki. iccd 1993: 155-158

1992

Self-timed pipeline with adderJohn Compton, Alexander Albicki. glvlsi 1992: 109-113 [doi]

An asynchronous multiplierBrenda Luderman, Alexander Albicki. glvlsi 1992: 104-108 [doi]

Design of Robust-Path-Delay-Fault-Testable Combinational Circuits by Boolean Space ExpansionXiaodong Xie, Alexander Albicki, Andrzej Krasniewski. iccd 1992: 482-485

1991

Random Testability of Redundant CircuitsAndrzej Krasniewski, Alexander Albicki. iccd 1991: 424-427

1989

An algorithm for voice and data integration on packet-switched local area networksChristopher Bucci, Alexander Albicki. iccd 1989: 156-159 [doi]

Comments on Ternary Scan Design for VLSI Testability Robert F. Molyneaux, Alexander Albicki. TC, 38(2):256-263, 1989.

1988

Prioritized access in CSMA networks: a node partitioning approachRajiv Arora, Alexander Albicki. lcn 1988: 275-280 [doi]

1985

Simulation-free estimation of speed degradation in NMOS self-testing circuits for CAD applicationsAndrzej Krasniewski, Alexander Albicki. dac 1985: 808-811 [doi]

Automatic Design of Exhaustively Self-Testing Chips with Bilbo ModulesAndrzej Krasniewski, Alexander Albicki. itc 1985: 362-371

Evaluation ot Monitor Complexity for Concurrently Testing Microprogrammed Control UnitsCarl Staelin, Alexander Albicki. itc 1985: 733-736

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