Andrzej Krasniewski, Leszek B. Wronski. Tests for path delay faults vs. tests for gate delay faults: how different they are. In Jean Mermet, editor, Proceedings EURO-DAC 94, European Design Automation Conference, Grenoble, France, September 19-22, 1994. pages 310-315, IEEE Computer Society, 1994. [doi]
Abstract is missing.