Rene Kregting, Sander Gielen, Willem D. van Driel, Paul Alkemade, Hozan Miro, Jan-Dirk Kamminga. Local stress analysis on semiconductor devices by combined experimental-numerical procedure. Microelectronics Reliability, 51(6):1092-1096, 2011. [doi]
@article{KregtingGDAMK11,
title = {Local stress analysis on semiconductor devices by combined experimental-numerical procedure},
author = {Rene Kregting and Sander Gielen and Willem D. van Driel and Paul Alkemade and Hozan Miro and Jan-Dirk Kamminga},
year = {2011},
doi = {10.1016/j.microrel.2011.03.010},
url = {http://dx.doi.org/10.1016/j.microrel.2011.03.010},
tags = {analysis},
researchr = {https://researchr.org/publication/KregtingGDAMK11},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {51},
number = {6},
pages = {1092-1096},
}