Willem D. van Driel - researchr alias

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Viewing Publication 1 - 27 from 27

2024

LED Degradation Monitoring Using a Multi-Channel Spectral SensorPaul Myland, Alexander Herzog, Sebastian Babilon, Willem D. van Driel, Tran Quoc Khanh. access, 12:42295-42315, 2024. [doi]

Uncertainty analysis and interval prediction of LEDs lifetimesRoberto Rocchetta, Zhouzhao Zhan, Willem D. van Driel, Alessandro Di Bucchianico. ress, 242:109715, February 2024. [doi]

2023

Lifetime Prediction of Current-and Temperature-Induced Degradation in Silicone-Encapsulated 365 nm High-Power Light-Emitting DiodesAlexander Herzog, Simon Benkner, Babak Zandi, Matteo Buffolo, Willem D. van Driel, Matteo Meneghini, Tran Quoc Khanh. access, 11:19928-19940, 2023. [doi]

2022

Advancements in Spectral Power Distribution Modeling of Light-Emitting DiodesSimon Benkner, Alexander Herzog, Stefan Klir, Willem D. van Driel, Tran Quoc Khanh. access, 10:83612-83619, 2022. [doi]

Investigation of Potting Compounds on Thermal-Fatigue properties of Solder InterconnectsLeiming Du, Xiujuan Zhao, Piet Watté, René Poelma, Willem D. van Driel, Guoqi Zhang. iecon 2022: 1-5 [doi]

2021

The H2020-ECSEL Project "iRel40" (Intelligent Reliability 4.0)Klaus Pressel, Josef Moser, Sven Rzepka, Klas Brinkfeldt, Susan Zhao, Willem D. van Driel, Paolo Giammatteo, Baris Bulut, Mujdat Soyturk, Luigi Pomante. dsd 2021: 311-318 [doi]

2018

A stochastic process based reliability prediction method for LED driverBo Sun, Xuejun Fan, Willem D. van Driel, Chengqiang Cui, Guoqi Zhang. ress, 178:140-146, 2018. [doi]

2014

Reliability and optical properties of LED lens plates under high temperature stressM. Yazdan Mehr, Willem D. van Driel, S. Koh, Guoqi Zhang. mr, 54(11):2440-2447, 2014. [doi]

Accelerated life time testing and optical degradation of remote phosphor platesM. Yazdan Mehr, Willem D. van Driel, G. Q. Zhang. mr, 54(8):1544-1548, 2014. [doi]

2012

Diagnosing Lumen Depreciation in LED Lighting Systems: An Estimation ApproachJianfei Dong, Ashish Pandharipande, Willem D. van Driel, Guoqi Zhang. tsp, 60(7):3796-3808, 2012. [doi]

2011

Local stress analysis on semiconductor devices by combined experimental-numerical procedureRene Kregting, Sander Gielen, Willem D. van Driel, Paul Alkemade, Hozan Miro, Jan-Dirk Kamminga. mr, 51(6):1092-1096, 2011. [doi]

Effect of high temperature aging on reliability of automotive electronicsDao-Guo Yang, F. F. Wan, Z. Y. Shou, Willem D. van Driel, H. Scholten, L. Goumans, Roberto Faria. mr, 51(9-11):1938-1942, 2011. [doi]

2010

2009

2008

2007

Mechanical reliability challenges for MEMS packages: CappingWillem D. van Driel, D. G. Yang, Cadmus A. Yuan, M. van Kleef, G. Q. (Kouchi) Zhang. mr, 47(9-11):1823-1826, 2007. [doi]

Molecular simulation on the material/interfacial strength of the low-dielectric materialsCadmus A. Yuan, Olaf van der Sluis, G. Q. (Kouchi) Zhang, Leo J. Ernst, Willem D. van Driel, Richard B. R. van Silfhout. mr, 47(9-11):1483-1491, 2007. [doi]

2004

Prediction of thermo-mechanical integrity of wafer backend processesViktor Gonda, Jaap M. J. den Toonder, Johan Beijer, G. Q. Zhang, Willem D. van Driel, R. J. O. M. Hoofman, Leo J. Ernst. mr, 44(12):2011-2017, 2004. [doi]

Prediction of crack growth in IC passivation layersY. T. He, M. A. J. van Gils, Willem D. van Driel, G. Q. Zhang, Richard B. R. van Silfhout, Leo J. Ernst. mr, 44(12):2003-2009, 2004. [doi]

Prediction of interfacial delamination in stacked IC structures using combined experimental and simulation methodsWillem D. van Driel, C. J. Liu, G. Q. Zhang, J. H. J. Janssen, Richard B. R. van Silfhout, M. A. J. van Gils, Leo J. Ernst. mr, 44(12):2019-2027, 2004. [doi]

Characterization and Modelling of Moisture Driven Interface FailuresM. A. J. van Gils, P. J. J. H. A. Habets, G. Q. Zhang, Willem D. van Driel, Piet J. G. Schreurs. mr, 44(9-11):1317-1322, 2004. [doi]

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