G. Hari Rama Krishna, Amit K. Aditya, Nirmal B. Chakrabarti, Swapna Banerjee. Analysis of temperature dependence of Si-Ge HBT. In 8th International Conference on VLSI Design (VLSI Design 1995), 4-7 January 1995, New Delhi, India. pages 268-271, IEEE Computer Society, 1995. [doi]
Abstract is missing.