Srini Krishnamoorthy, Vishak Venkatraman, Yuri Apanovich, Thomas Burd, Anand Daga. Switching constraint-driven thermal and reliability analysis of Nanometer designs. In Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011, Santa Clara, California, USA, 14-16 March 2011. pages 473-480, IEEE, 2011. [doi]
Abstract is missing.