Shaji Krishnan, Klaas D. Doornbos, Rudi Brand, Hans G. Kerkhoff. Block-level bayesian diagnosis of analogue electronic circuits. In Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010. pages 1767-1772, IEEE, 2010. [doi]
@inproceedings{KrishnanDBK10,
title = {Block-level bayesian diagnosis of analogue electronic circuits},
author = {Shaji Krishnan and Klaas D. Doornbos and Rudi Brand and Hans G. Kerkhoff},
year = {2010},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5457100},
researchr = {https://researchr.org/publication/KrishnanDBK10},
cites = {0},
citedby = {0},
pages = {1767-1772},
booktitle = {Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010},
publisher = {IEEE},
}