Shaji Krishnan, Hans G. Kerkhoff. Exploiting Multiple Mahalanobis Distance Metrics to Screen Outliers From Analog Product Manufacturing Test Responses. IEEE Design & Test of Computers, 30(3):18-24, 2013. [doi]
@article{KrishnanK13-0,
title = {Exploiting Multiple Mahalanobis Distance Metrics to Screen Outliers From Analog Product Manufacturing Test Responses},
author = {Shaji Krishnan and Hans G. Kerkhoff},
year = {2013},
doi = {10.1109/MDT.2012.2206552},
url = {http://doi.ieeecomputersociety.org/10.1109/MDT.2012.2206552},
researchr = {https://researchr.org/publication/KrishnanK13-0},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {30},
number = {3},
pages = {18-24},
}