Deepak Krishnankutty, Ryan Robucci, Nilanjan Banerjee, Chintan Patel. Fiscal: Firmware identification using side-channel power analysis. In 35th IEEE VLSI Test Symposium, VTS 2017, Las Vegas, NV, USA, April 9-12, 2017. pages 1-6, IEEE, 2017. [doi]
Abstract is missing.