Comparative BTI reliability analysis of SRAM cell designs in nano-scale CMOS technology - researchr publication authors

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Shreyas Kumar Krishnappa, Hamid Mahmoodi. Comparative BTI reliability analysis of SRAM cell designs in nano-scale CMOS technology. In Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011, Santa Clara, California, USA, 14-16 March 2011. pages 384-389, IEEE, 2011. [doi]

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