Shreyas Kumar Krishnappa, Hamid Mahmoodi. Comparative BTI reliability analysis of SRAM cell designs in nano-scale CMOS technology. In Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011, Santa Clara, California, USA, 14-16 March 2011. pages 384-389, IEEE, 2011. [doi]
@inproceedings{KrishnappaM11,
title = {Comparative BTI reliability analysis of SRAM cell designs in nano-scale CMOS technology},
author = {Shreyas Kumar Krishnappa and Hamid Mahmoodi},
year = {2011},
doi = {10.1109/ISQED.2011.5770755},
url = {http://dx.doi.org/10.1109/ISQED.2011.5770755},
tags = {analysis, reliability},
researchr = {https://researchr.org/publication/KrishnappaM11},
cites = {0},
citedby = {0},
pages = {384-389},
booktitle = {Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011, Santa Clara, California, USA, 14-16 March 2011},
publisher = {IEEE},
isbn = {978-1-61284-914-0},
}