Smita Krishnaswamy, Igor L. Markov, John P. Hayes. Tracking Uncertainty with Probabilistic Logic Circuit Testing. IEEE Design & Test of Computers, 24(4):312-321, 2007. [doi]
@article{KrishnaswamyMH07,
title = {Tracking Uncertainty with Probabilistic Logic Circuit Testing},
author = {Smita Krishnaswamy and Igor L. Markov and John P. Hayes},
year = {2007},
doi = {10.1109/MDT.2007.146},
url = {http://doi.ieeecomputersociety.org/10.1109/MDT.2007.146},
tags = {testing, Markov, logic},
researchr = {https://researchr.org/publication/KrishnaswamyMH07},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {24},
number = {4},
pages = {312-321},
}